Marla Dowell
Marla Dowell is Director of the CHIPS Metrology Program and NIST Boulder Laboratory. Dowell is expanding and advancing NIST’s efforts to deliver a robust measurement science foundation for the semiconductor industry. Dowell began her NIST career as a researcher in the field of optical metrology for photolithography. Her work has enabled better optical measurements for photodynamic therapy to treat cancer, laser safety, communications and manufacturing. She has a Ph.D. in physics and a MBA with emphasis on technology and innovation.
NIST Boulder Laboratory
https://www.nist.gov/people/marla-l-dowell
Marla
Dowell